Surface Roughness Study by Atomic Force Microscopy

für 44.10€ kaufen ··· 9783848400355 ··· 1036118048 ···
AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.
Hersteller: LAP Lambert Academic Publishing
Marke: LAP Lambert Academic Publishing
EAN: 9783848400355
Kat: Hardcover/Naturwissenschaften, Medizin, Informatik, Technik/Physik, Astronomie/Theoretische Physik
Lieferzeit: Sofort lieferbar
Versandkosten: Ab 20¤ Versandkostenfrei in Deutschland
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5: Ab 20¤ Versandkostenfrei in Deutschland
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7: Surface Roughness Study by Atomic Force Microscopy
:::: Hardcover/Naturwissenschaften, Medizin, Informatik, Technik/Physik, Astronomie/Theoretische Physik

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···· aufgenommen: 30.07.2020 · 02:10:46
···· & überprüft: 13.11.2020 · 03:50:20

: Surface : Roughness : Atomic : Microscopy :

Surface Roughness Study by Atomic Force Microscopy

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